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The role of ultra-thin carbon barrier layers for fabrication of La/B4C interferential mirrors: Study by time-of-flight secondary ion mass spectrometry and high-resolution transmission electron microscopy

Materials ScienceEngineeringElectron MicroscopyLa/b4c Interferential MirrorsMicroscopySpectroscopyScanning Probe MicroscopyMass SpectrometryApplied PhysicsMicroanalysisElectron MicroscopeMedicine