Electron interferometry and interference electron microscopy

Abstract

A state-of-the-art review of electron interferometry and interference electron microscopy is given. The various types of interferometry device, interferometers and interference microscopes, which have been proposed and/or constructed are reviewed and commented upon. The electron biprism, by far the most successful interferometry device, is treated in some detail from both the experimental and theoretical (geometric and wave optics) points of view. The applications of electron interferometry are presented with particular reference to off-axis electron holography. Finally the future perspectives are indicated.