Philosophical magazine · 1976 · 55 citations · 6 references
Natural SciencesMaterials SciencePhysicsOpticsSurface ScienceElectron MicroscopySurface MicroscopySurface PhysicsSurface SpectroscopyField EmissionHigh-resolution Electron MicroscopyMicrostructural CharacterizationMicrostructural ImagingScanning Auger MicroscopyScanning Electron MicroscopyScanning Electron Microscopy AnalysisScanning Electron Microscopy Surface Analysis
Abstract Auger electron images and analysis have been obtained with a spatial resolution of 30 nm, using an ultra-high vacuum field emission scanning electron microscope fitted with a cylindrical mirror analyser. This represents a large improvement over currently available instruments, and has important implications for microstructural studies of surfaces.
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