Electrical characteristics of Al/SiO2/n-Si tunnel diodes with an oxide layer grown by rapid thermal oxidation - Concepedia

Concepedia

Publication | Closed Access

Electrical characteristics of Al/SiO2/n-Si tunnel diodes with an oxide layer grown by rapid thermal oxidation

133

Citations

26

References

1994

Year

Michel Depas, R.L. Van Meirhaeghe, W.H. Laflère, F. Cardon

Solid-State Electronics

Materials ScienceElectrical CharacteristicsElectrical EngineeringEngineeringRapid Thermal OxidationOxide ElectronicsAl/sio2/n-si Tunnel DiodesApplied PhysicsSemiconductor Device

References

	Year	Citations

Page 1