Journal of Electronic Materials · 1976 · 82 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsResidual StressSemiconductor DefectsSemiconductor Device MaterialsSemiconductor ReliabilityStress-strain BehaviorThin Film StrainNitride Thin FilmsNitrides Thin FilmsResidual Stress EffectsResidual Stress In Thin FilmsSilicon Nitride
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