Publication | Closed Access
Ultra-thick gate oxides: charge generation and its impact on reliability
67
Citations
5
References
2001
Year
Materials ScienceElectrical EngineeringEngineeringNanoelectronicsStress-induced Leakage CurrentBias Temperature InstabilityApplied PhysicsOxide ElectronicsMicroelectronicsCharge GenerationSemiconductor Device
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