Concepedia

Publication | Closed Access

Optical properties of SiC investigated by spectroscopic ellipsometry from 3.5 to 10 eV

DOI

31

Citations

14

References

2000

Year

Christoph Cobet, K. Wilmers, T. Wethkamp, N. V. Edwards, N. Esser, W. Richter
Thin Solid Films

References

YearCitations

Page 1