Improved charge neutralization method for depth profiling of bulk insulators using O2+ primary beam on a magnetic sector SIMS instrument

Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurements

H. W. Werner, A. E. Morgan · Journal of Applied Physics · 1976 · 128 citations

Natural Sciences, Materials Engineering, Materials Science +13

Primary-ion charge compensation in SIMS analysis of insulators

K. Wittmaack · Journal of Applied Physics · 1979 · 62 citations

Natural Sciences, Materials Science, Physics +13

Analysis of insulating specimens with the Cameca IMS4f

H.‐N. Migeon, M. Schuhmacher, G. Slodzian · Surface and Interface Analysis · 1990 · 40 citations

Natural Sciences, Materials Science, Elemental Analysis +9

Secondary Ion Mass Spectrometry(II)

Jun Okano · Shitsuryou bunseki/Shitsuryo Bunseki · 1976 · 33 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +12

Analysis of alkali elements in insulators using a CAMECA IMS-6f

Jennifer McKinley, F. A. Stevie, C. N. Granger et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2000 · 17 citations

Natural Sciences, Chemistry, Analytical Chemistry +15