Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1987 · 16 citations · 0 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsElectronic Band StructurePhotoelectron SpectroscopyRaman SpectroscopySemiconductor PhysicsWide Band Gap SemiconductorsWide-bandgap SemiconductorsBand Gap DeterminationEnergy Band GapRaman ScatteringResonant ScatteringValence BandValence Band StructureValence ElectronsValence-band Spectroscopy
In this paper we present experimental data related to the determination of the valence-band offset between HgTe and CdTe. Magneto-optical and resonant Raman scattering data are consistent with a small valence-band offset, i.e., Λ<100 meV. From our x-ray photoelectron spectroscopy (XPS) measurements carried out on CdTe//HgTe(1̄1̄1̄)B and HgTe//CdTe(1̄1̄1̄)B we found Λ=0.36±0.06 eV in very good agreement with data previously reported. We discuss the different assumptions made in the determination of Λ by XPS. The reason for such a discrepancy is not understood at the present time even though we propose two factors which could contribute to such a difference.