IEEE Transactions on Computers · 1971 · 98 citations · 6 references
EngineeringComputer EngineeringFault-tolerant ComputingFault-tolerant SystemsCombinational Logic DescriptionDesign For TestabilityFault DetectionFault DiagnosisAutomatic Test Pattern GenerationCause-effect RelationsCause-effect RelationshipsCombinatorial TestingDiagnostic Test Generation
The important problem of generating test patterns to detect multiple faults has received little attention, mainly due to their computational complexity. The theoretical results of this paper show that near minimal tests for multiple faults can be generated with complexity of computation comparable to that of single faults.
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