IEEE Electron Device Letters · 1988 · 66 citations · 10 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsMicrowave EngineeringSemiconductor DevicesDevice CharacterizationHigh-frequency Semiconductor DevicesMicrowave Integrated CircuitsMicrowave Semiconductor DevicesSemiconductor HeterostructuresSemiconductor PhysicsHeterostructure DevicesKink InstabilityMicrowave DevicesSemiconductor CharacterizationTrapping Effects
The authors report the influence of the kink effect on the DC and microwave performance of i-InAlAs heterojunction doped-channel MESFETs lattice matched to an InP substrate with submicrometer gates. Kink effects were observed at room temperature as well as at 77 K in the DC measurement. The kinks seem to be related to deep-level electron trapping, and are not present at microwave frequencies. Measured results are presented showing that the existence of kinks at low operating frequencies does not seem to degrade the microwave performance of the devices.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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High-performance submicrometer AlInAs-GaInAs HEMT's
Umesh K. Mishra, April S. Brown, L.M. Jelloian et al. · IEEE Electron Device Letters · 1988 · 93 citations