An efficient built-in self test method for robust path delay fault testing - Concepedia

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An efficient built-in self test method for robust path delay fault testing

31

Citations

3

References

1996

Year

Ioannis Voyiatzis, A. Paschalis, D. Nikolos, C. Halatsis

Journal of Electronic Testing

Reliability EngineeringEngineeringSystem TestingSoftware TestingVerificationFault AnalysisComputer EngineeringSystems EngineeringBuilt-in Self-testFormal VerificationFault InjectionDesign For Testing

References

	Year	Citations

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