Concepedia
Microelectronics Reliability · 2014 · 20 citations · 11 references
Materials ScienceEngineeringMechanical EngineeringTensile PropertiesElectric Flame-offSilver–lanthanum Alloy WireMicrostructure
11
Electromigration effect upon the Sn/Ag and Sn/Ni interfacial reactions at various temperatures
Chih‐Ming Chen, S.-W. Chen · Acta Materialia · 2002 · 130 citations
Materials Science, Various Temperatures, Electromigration Effect +6
Overview of wire bonding using copper wire or insulated wire
Z.W. Zhong · Microelectronics Reliability · 2010 · 103 citations
Materials Science, Electrical Engineering, Engineering +5
A comparison of copper and gold wire bonding on integrated circuit devices
S.L. Khoury, D.J. Burkhard, David Galloway et al. · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1990 · 98 citations
Engineering, Device Integration, Reliability Results +16
Challenges and developments of copper wire bonding technology
Peisheng Liu, Liangyu Tong, Jinlan Wang et al. · Microelectronics Reliability · 2011 · 92 citations
Materials Science, Materials Engineering, Electrical Engineering +6
Grains, deformation substructures, and slip bands observed in thermosonic copper ball bonding
S. Murali, Narasimalu Srikanth, Charles J. Vath · Materials Characterization · 2003 · 87 citations
Materials Engineering, Materials Science, Deformation Substructures +9