Japanese Journal of Applied Physics · 1968 · 34 citations · 0 references
EngineeringElectrical EngineeringMaterials ScienceCeramic MaterialsElectronic MaterialsSemiconductor MaterialsCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice SimulationOhm's LawSemiconductor ReliabilityDevice VariabilityDiode Current-voltage CharacteristicsForward Bias CharacteristicsSilicon Carbide (Sic) MaterialsTemperature Dependence Of I-v CurvesVaristor BehaviorVaristor Ceramics