Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation

Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

Franz J. Gießibl · Science · 1995 · 1.2K citations · Full text

Natural Sciences, Materials Science, Physics +17

Atomic-scale formation of ultrasmooth surfaces on sapphire substrates for high-quality thin-film fabrication

Mamoru Yoshimoto, Tatsuro Maeda, Tsuyoshi Ohnishi et al. · Applied Physics Letters · 1995 · 399 citations

Natural Sciences, Materials Science, Physics +17

Regulation of a microcantilever response by force feedback

Jérôme Mertz, Othmar Marti, J. Mlynek · Applied Physics Letters · 1993 · 265 citations

Engineering, Mechanical Engineering, Microelectromechanical Systems +16

High-speed tapping mode imaging with active <i>Q</i> control for atomic force microscopy

Todd Sulchek, Robert Hsieh, Jonathan D. Adams et al. · Applied Physics Letters · 2000 · 222 citations

Engineering, Mechanical Engineering, Actuators +16

Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulation

Boris Anczykowski, J. P. Cleveland, Daniel H. Kruger et al. · Applied Physics A · 1998 · 187 citations

Engineering, Mechanical Engineering, Computational Mechanics +13