Yoichi Miyahara

Cantilever-based sensing: the origin of surface stress and optimization strategies

Michel Godin, Vincent Tabard‐Cossa, Yoichi Miyahara et al. · Nanotechnology · 2010 · 137 citations

Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy

Romain Stomp, Yoichi Miyahara, S. Schaer et al. · Physical Review Letters · 2005 · 117 citations · Full text

Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

Lynda Cockins, Yoichi Miyahara, Steven Bennett et al. · Proceedings of the National Academy of Sciences · 2010 · 86 citations · Full text

Atomic Force Microscopy, Engineering, Microscopy +21

Electrostatic moiré potential from twisted hexagonal boron nitride layers

Dong Seob Kim, Roy C. Dominguez, Rigo Mayorga-Luna et al. · Nature Materials · 2023 · 83 citations

Boron Nitride, Engineering, Physics +5

Strong Electromechanical Coupling of an Atomic Force Microscope Cantilever to a Quantum Dot

Steven Bennett, Lynda Cockins, Yoichi Miyahara et al. · Physical Review Letters · 2010 · 82 citations · Full text

Versus Oscillation Amplitude, Engineering, Microscopy +19