IEEE Transactions on Microwave Theory and Techniques · 1989 · 48 citations · 4 references
EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsMicrowave EngineeringDevice CharacterizationElectrical MeasurementMicrostrip CircuitsMicrowave Network AnalysisMicrowave Transmission LinesTransmission LinesCalibration StandardsDe-embedding TechniquesMicrowave Network CharacterizationNetwork Parameter ExtractionS-parameter CharacterizationS-parameter MeasurementS-parameter ModelingTransmission Line Theory
A simple method for de-embedding S parameters of devices in microstrip is presented. The use of only one transmission line and two nonideal shorts or opens of different lengths as calibration standards allows the determination of the unknown S parameters of the connectors and the complex propagation coefficient of the lines.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Diffusion of transition elements in GaAs and InP
M.R. Brozel, B. Tuck, E. J. Foulkes · Electronics Letters · 1981 · 19 citations