Publication | Closed Access
Composition analysis of single semiconductor nanowires using pulsed-laser atom probe tomography
52
Citations
27
References
2006
Year
Materials ScienceComposition AnalysisEngineeringPhysicsNanomaterialsNanotechnologyScanning Probe MicroscopyApplied PhysicsNanoscale ModelingSingle Semiconductor NanowiresNanometrologyNanoscale ScienceSemiconductor Nanostructures
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