J.L. Lensch

Near-field scanning photocurrent microscopy of a nanowire photodetector

Yi Gu, Eun Soo Kwak, J.L. Lensch et al. · Applied Physics Letters · 2005 · 220 citations

Engineering, Electrical Engineering, Materials Science +17

Quantitative Measurement of the Electron and Hole Mobility−Lifetime Products in Semiconductor Nanowires

Yi Gu, John Romankiewicz, John K. David et al. · Nano Letters · 2006 · 111 citations

Engineering, Electrical Engineering, Materials Science +17

Composition analysis of single semiconductor nanowires using pulsed-laser atom probe tomography

Daniel E. Perea, J.L. Lensch, Steven J. May et al. · Applied Physics A · 2006 · 52 citations

Natural Sciences, Materials Science, Physics +14

Growth and characterization of OMVPE grown (In,Mn)As diluted magnetic semiconductor

A. J. Blattner, J.L. Lensch, Bruce W. Wessels · Journal of Electronic Materials · 2001 · 49 citations

Natural Sciences, Materials Engineering, Materials Science +10

Low-temperature photoluminescence imaging and time-resolved spectroscopy of single CdS nanowires

Lyubov V. Titova, Thang B. Hoang, Howard E. Jackson et al. · Applied Physics Letters · 2006 · 48 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17