Characterization of catastrophic optical damage in Al-free InGaAs/InGaP 0.98 μm high-power lasers

Abstract

Catastrophic optical damage (COD) in Al-free InGaAs/InGaP 0.98 μm lasers has been investigated using real-time electroluminescence (EL) and transmission electron microscopy (TEM). From EL images, we observed that multiple bright spots initiated from one of the facets and then propagated to the center of the cavity during the COD process. It is clarified by the TEM analysis that the propagation of bright spots resulted in 60-nm-wide Moiré fringe along the cavity and the crystalline phase of the active area became polycrystalline. Highly nonradiative polycrystalline phase of the active area is the major cause of COD failure in the Al-free 0.98 μm lasers.