Electrochemically deposited cobalt/platinum (Co/Pt) film into porous silicon: Structural investigation and magnetic properties

X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials.

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Engineering, Media Standards, Altmetric Attention Score +17

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A. G. Cullis, Leigh Canham, P. D. J. Calcott · Journal of Applied Physics · 1997 · 2.5K citations

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V. Lehmann · Journal of The Electrochemical Society · 1993 · 690 citations

Materials Science, Semiconductor Technology, Pore Structure +13

Luminescence degradation in porous silicon

M. A. Tischler, R. T. Collins, J. H. Stathis et al. · Applied Physics Letters · 1992 · 465 citations

Optical Materials, Engineering, Photoluminescence +12

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V. Lehmann, Silke Rönnebeck · Journal of The Electrochemical Society · 1999 · 461 citations

Electrical Engineering, Engineering, Crystalline Defects +13