Determination of lattice parameters in the epitaxial system by high resolution X-ray diffraction - Concepedia

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Determination of lattice parameters in the epitaxial system by high resolution X-ray diffraction

23

Citations

10

References

1996

Year

C. Bocchi, A. Bosacchi, C. Ferrari, S. Franchi, P. Fṙanzosi, R. Magnanini, L. Nasi

Journal of Crystal Growth

X-ray CrystallographyMaterials ScienceEngineeringEpitaxial SystemX-ray DiffractionCondensed Matter PhysicsApplied PhysicsLattice ParametersMolecular Beam EpitaxySynchrotron RadiationEpitaxial GrowthCrystallography

References

	Year	Citations

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