Publication | Closed Access
Photo-Ionizalion Assisted Photo-CVD of Silicon Nitride Film by Microwave-Excited Deuterium Lamp
15
Citations
18
References
1986
Year
EngineeringMicrowave-excited Deuterium LampSilicon Nitride FilmOptoelectronic DevicesIntegrated CircuitsChemistryHigh Density FilmPhoto-ionizalion Assisted Photo-cvdSemiconductor InterfacesOptical PropertiesCompound SemiconductorPhotonicsElectrical EngineeringPhotoluminescencePhotochemistryOptoelectronic MaterialsPhotoelectric MeasurementPlasma EtchingPhoto-cvd ApparatusSurface ScienceApplied PhysicsSubstrate SurfaceThin FilmsOptoelectronicsChemical Vapor Deposition
Silicon nitride films have been formed using a photo-CVD apparatus with a microwave-excited deuterium lamp. The BHF etching rate, 40–70 Å/ min, deposited at 320°C is lower by less than one-tenth than that deposited using a conventional low-pressure mercury lamp, indicating formation of a high density film. The deposition rate has been enhanced dramatically from 13 Å/min to 100 Å/min by incorporating the photo-ionization assisted effect, which is brought about by an ionization of a substrate surface, ions formed by collisions of reactant gases with photoelectrons and photo-ionized ions.
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