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In situ monitoring of InAs-on-GaAs quantum dot formation in MOVPE by reflectance-anisotropy-spectroscopy and ellipsometry

DOI

36

Citations

19

References

1996

Year

E. Steimetz, J.‐T. Zettler, F. Schienle, T. Trepk, T. Wethkamp, W. Richter, I. Sieber
Applied Surface Science

References

YearCitations

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