2 keV Ga+ FIB Milling for Reducing Amorphous Damage in Silicon

L. A. Giannuzzi, Remco Geurts, J. Ringnalda

Microscopy and Microanalysis · 2005 · 96 citations · 0 references

DOIFull text

Open access

Concepts

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005