Characterization and Screening of SiO2 Defects in EEPROM Structures

Fowler-Nordheim Tunneling into Thermally Grown SiO2

M. Lenzlinger, E. H. Snow · Journal of Applied Physics · 1969 · 1.7K citations

Natural Sciences, Materials Science, Physics +14

Time-Zero Dielectric Reliability Test by a Ramp Method

ARNOLD T. BERMAN · Reliability physics · 1981 · 197 citations

Engineering, Electrical Engineering, Condition Assessment +16

New EPROM Data-Loss Mechanisms

Neal Mielke · Reliability physics · 1983 · 44 citations

Engineering, Materials Engineering, Materials Science +16

Data Retention in EPROMS

R. E. Shiner, J. M. Caywood, B.L. Euzent · Reliability physics · 1980 · 43 citations

Computing, Information Systems, Data Management +2