Journal of Electronic Materials · 2003 · 175 citations · 8 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsMetallic MaterialsSemiconductor DevicesChip PackagingDevice ReliabilityInterconnect TechnologyMetalsSemiconductor ReliabilityThermal Properties Of MaterialsFatigue LifeInterconnect CharacterizationInterconnect ReliabilityOn-chip InterconnectsReliability DegradationThermal FatigueThermomechanical Fatigue
8