Reaction of Si(100) surfaces with C2H4: XPS and LEED studies

Determining hybridization differences for amorphous carbon from the XPS C 1s envelope

S. David Jackson · Applied Surface Science · 1995 · 423 citations

Natural Sciences, Chemistry, Materials Science +7

Thin film deposition and microelectronic and optoelectronic device fabrication and characterization in monocrystalline alpha and beta silicon carbide

R. F. Davis, G. Kelner, M. S. Shur et al. · Proceedings of the IEEE · 1991 · 407 citations

Engineering, Electrical Engineering, Materials Science +17

Comparative electron spectroscopic studies of surface segregation on SiC(0001) and SiC(0001)

L. Muehlhoff, W. J. Choyke, M. J. Bozack et al. · Journal of Applied Physics · 1986 · 283 citations

Natural Sciences, Materials Engineering, Materials Science +12

The adsorbed states of ethylene on Si(100)<i>c</i>(4×2), Si(100)(2×1), and vicinal Si(100) 9°: Electron energy loss spectroscopy and low-energy electron diffraction studies

Jun Yoshinobu, Hiroyuki Tsuda, M. Onchi et al. · The Journal of Chemical Physics · 1987 · 257 citations

Natural Sciences, Chemistry, Materials Science +17

Adsorption and thermal behavior of ethylene on Si(100)-(2 × 1)

L. L. Clemen, Robert M. Wallace, Patrick Taylor et al. · Surface Science · 1992 · 201 citations

Natural Sciences, Chemistry, Materials Science +12