Publication | Closed Access
Calibration of step heights and roughness measurements with atomic force microscopes
58
Citations
5
References
2002
Year
Atomic Force MicroscopesPrecision MeasurementEngineeringPhysicsMeasurementMechanicsMicroscopyCalibrationApplied PhysicsMaterials CharacterizationScanning Force MicroscopyEducationScanning Probe MicroscopyNanometrologyInstrumentationStep HeightsRoughness Measurements
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