Publication | Closed Access
Correction to "Revision of Tunneling Field-Effect Transistor in Standard CMOS Technologies"
41
Citations
3
References
2007
Year
Device ModelingTunneling JunctionElectrical EngineeringEngineeringTunneling MicroscopyNanoelectronicsElectronic EngineeringField-effect TransistorBias Temperature InstabilityTunnelingResistive Source ConnectionStandard Cmos TechnologiesMicroelectronicsBeyond CmosSemiconductor Device
Previously published results by the authors, from 2004 to 2006, on the tunneling field-effect transistor (TFET) are revised in this correction. The devices that they had characterized as TFETs contain a conducting path in parallel to the intended tunneling junction. Therefore, the measured characteristics are similar to a MOSFET with a resistive source connection
| Year | Citations | |
|---|---|---|
Page 1
Page 1