Japanese Journal of Applied Physics · 1997 · 32 citations · 5 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials ChemistrySpectroscopyThin FilmsRaman SpectroscopySurface PhysicsPolycrystalline Thin FilmsPyrolysisRaman Data AnalysisRaman SpectraRaman Spectral AssignmentSpray PyrolysisSubstrate Temperature EffectsX-ray Diffraction Analysis
Raman spectra have been investigated for CuInSe 2 polycrystalline thin films prepared by chemical spray pyrolysis. The A 1 mode Raman peak at 174 cm -1 , the dominant peak in CuInSe 2 with a chalcopyrite structure, and a peak at 182 cm -1 have been observed. The A 1 mode peak is dominant for Cu-rich films and stoichiometric films deposited at high substrate temperature. On the other hand, the 182 cm -1 peak is dominant for In-rich films and stoichiometric films deposited at low substrate temperature. By comparing the Raman results with the X-ray diffraction measurements, the peak at 182 cm -1 is found to be characteristic of CuInSe 2 with a sphalerite structure.
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