Microelectronics Reliability · 2010 · 73 citations · 18 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice ReliabilityDurabilityDurability TestingEndurance PerformanceMaterial DurabilitySemiconductor ReliabilityDevice DurabilityEnduranceStretchable Electronics SubstratesStretchable MaterialsWear-out Mechanisms
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The exponential law of endurance tests
Oh. Basquin · Medical Entomology and Zoology · 1910 · 1.4K citations
Thermal Stress and Low Cycle Fatigue
S. S. Manson, Thomas J. Dolan · Journal of Applied Mechanics · 1966 · 727 citations · Full text
Stretchable Interconnects for Elastic Electronic Surfaces
Stéphanie P. Lacour, Joyelle Jones, S. Wagner et al. · Proceedings of the IEEE · 2005 · 618 citations · Full text
Natural Sciences, Electrical Engineering, Materials Science +17