Publication | Closed Access
The electron irradiation effects on silicon gate dioxide used for power MOS devices
26
Citations
6
References
2001
Year
Electrical EngineeringEngineeringElectron Irradiation EffectsPhysicsNanoelectronicsBias Temperature InstabilityApplied PhysicsSilicon Gate DioxidePower Mos DevicesMicroelectronicsSilicon On InsulatorSemiconductor Device
| Year | Citations | |
|---|---|---|
Page 1
Page 1