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Assessment of defect reduction methods for nonpolar a-plane GaN grown on r-plane sapphire

Materials EngineeringWide-bandgap SemiconductorElectrical EngineeringEngineeringDefect Reduction MethodsR-plane SapphireApplied PhysicsAluminum Gallium NitrideGan Power DeviceNonpolar A-plane GanCategoryiii-v SemiconductorOptoelectronics