Characterization of Traveling Heater Method (THM) Grown ${\hbox{Cd}}_{0.9}{\hbox{Zn}}_{0.1}{\hbox{Te}}$ Crystals

Abstract

High-performance semi-insulating single crystals of n-type (CZT) were grown using the traveling heater method (THM). X-ray and -ray detector configurations fabricated from this material have a room-temperature mean energy resolution of 4.3% FWHM for a source (122 keV) and uniform pixel-to-pixel response on monolithic 20205 pixellated detectors. Energy resolution of 1% FWHM for (662keV) has been measured on virtual Frisch-grid 4411 devices useful for homeland security applications. Additional characterization techniques including mobility-lifetime measurements, infrared microscopy, X-ray topography, and OPTICAL Deep Level Transient Spectroscopy (ODLTS) have demonstrated the superior quality of this THM CZT.