Correlation of Raman and X-ray diffraction measurements of annealed pulsed laser deposited ZnO thin films - Concepedia

Concepedia

Publication | Closed Access

Correlation of Raman and X-ray diffraction measurements of annealed pulsed laser deposited ZnO thin films

47

Citations

17

References

2003

Year

Chaitali Roy, S. A. Byrne, E. McGlynn, Jean-Paul Mosnier, E. de Posada, Donal O’Mahony, J. G. Lunney, M. Henry, Brendan Ryan, A.A. Cafolla

Thin Solid Films

Materials ScienceEngineeringOptical PropertiesOxide ElectronicsApplied PhysicsLaser-assisted DepositionThin FilmsPulsed Laser DepositionX-ray Diffraction MeasurementsZno Thin FilmsThin Film Processing

References

	Year	Citations

Page 1

Page 1