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Anisotropy Contrast in Phonon-Enhanced Apertureless Near-Field Microscopy Using a Free-Electron Laser
79
Citations
29
References
2008
Year
Optical MaterialsEngineeringMicroscopyPhonon ResonanceMultiferroicsContrast ReversalElectron MicroscopyFerroelectric ApplicationMicroscopy MethodOptical PropertiesFree-electron LaserLight MicroscopyPhysicsDielectric TensorFerroelasticsNatural SciencesSpectroscopyScanning Probe MicroscopyBiomedical ImagingApplied PhysicsFerroelectric MaterialsAnisotropy Contrast
We demonstrate the imaging of ferroelectric domains in BaTiO3, using an infrared-emitting free-electron laser as a tunable optical source for scattering scanning near-field optical microscopy and spectroscopy. When the laser is tuned into the spectral vicinity of a phonon resonance, ferroelectric domains can be resolved due to the anisotropy of the dielectric properties of the material. Slight detuning of the wavelength gives rise to a contrast reversal clearly evidencing the resonant character of the excitation. The near-field domain contrast shows that the orientation of the dielectric tensor with respect to the sample surface has a clear influence on the near-field signal.
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