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Technical aspects of applying high frequency densitometry: Probe-sample contact, sample surface preparation and integration width of different dielectric probes

Electrical EngineeringEngineeringDifferent Dielectric ProbesAnalytical InstrumentationMeasurementMicroscopySpectroscopyCalibrationApplied PhysicsHigh Frequency DensitometryScanning Probe MicroscopyEducationInstrumentationTechnical AspectsHigh-frequency MeasurementElectrical InsulationElectromagnetic Compatibility