High-frequency Measurement
High-Frequency Measurement is a metrological method that characterizes electrical signals and systems operating at frequencies typically above 1 MHz, distinguished by the need to account for distributed parameters, electromagnetic effects, and parasitic components not significant in lower-frequency regimes.
444
Publications
15.9K
Citations
1.7K
Authors
561
Institutions
Publications per year
2017–2026
97
Parents
444
1–5 of 444
1.7K
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University of Electronic Science and Technology of China, China
4 publications · 108 citations
4
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4
h-index
National Institute of Standards and Technology, United States
3 publications · 105 citations
3
h-index
1–5 of 1.7K
561

Centre National de la Recherche Scientifique
Paris, France
14 h-index
55 publications
1.1K citations
National Institute of Standards and Technology
Gaithersburg, United States
9 h-index
23 publications
854 citations
University of Stuttgart
Stuttgart, Germany
7 h-index
31 publications
1.3K citations

University of Electronic Science and Technology of China
Chengdu, China
6 h-index
35 publications
1.1K citations

National Physical Laboratory
London, United Kingdom
6 h-index
20 publications
409 citations
Tsinghua University
Beijing, China
6 h-index
30 publications
698 citations
The University of Texas at Austin
Austin, United States
5 h-index
10 publications
515 citations

Nanjing University of Aeronautics and Astronautics
Nanjing, China
5 h-index
19 publications
547 citations
1–8 of 561
14 publications · 383 citations
12
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11 publications · 331 citations
11
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9 publications · 336 citations
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8 publications · 442 citations
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8 publications · 279 citations
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