High-frequency Measurement

High-Frequency Measurement is a metrological method that characterizes electrical signals and systems operating at frequencies typically above 1 MHz, distinguished by the need to account for distributed parameters, electromagnetic effects, and parasitic components not significant in lower-frequency regimes.

444

Publications

15.9K

Citations

1.7K

Authors

561

Institutions

Publications per year

2017–2026

97

Authors

1.7K

  1. PP
    Przemysław Podulka

    Rzeszów University of Technology, Poland

    5 publications · 103 citations

    5

    h-index

  2. SP
    Shilong Pan

    Nanjing University of Aeronautics and Astronautics, China

    5 publications · 140 citations

    5

    h-index

  3. HZ
    Huaiwu Zhang

    University of Electronic Science and Technology of China, China

    4 publications · 108 citations

    4

    h-index

  4. MJ
    M.D. Judd

    University of Strathclyde, United Kingdom

    4 publications · 185 citations

    4

    h-index

  5. DF
    Dylan F. Williams

    National Institute of Standards and Technology, United States

    3 publications · 105 citations

    3

    h-index

1–5 of 1.7K

Venues

  1. Review of Scientific Instruments

    14 publications · 383 citations

    12

    h-index

  2. 11

    h-index

  3. Applied Physics Letters

    9 publications · 336 citations

    9

    h-index

  4. 8

    h-index

  5. 8

    h-index

1–5