Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications

Atomic Force Microscope

G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text

Natural Sciences, Materials Science, Physics +14

Piezoresistance Effect in Germanium and Silicon

Charles S. Smith · Physical Review · 1954 · 2K citations

Natural Sciences, Materials Science, Physics +10

Single spin detection by magnetic resonance force microscopy

D. Rugar, Raffi Budakian, H. J. Mamin et al. · Nature · 2004 · 1.6K citations

Natural Sciences, Biophysics, Physics +14

Cantilever transducers as a platform for chemical and biological sensors

Nickolay V. Lavrik, Michael J. Sepaniak, Panos G. Datskos · Review of Scientific Instruments · 2004 · 1.1K citations

Engineering, Bioengineering, Biomedical Engineering +17

1/ƒ noise is no surface effect

F.N. Hooge · Physics Letters A · 1969 · 1.1K citations

Natural Sciences, Geophysics, Acoustics +5