Displacement damage degradation of ion-induced charge in Si pin photodiode - Concepedia

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Displacement damage degradation of ion-induced charge in Si pin photodiode

19

Citations

6

References

2003

Year

Shinobu Onoda, Toshio Hirao, Jamie S. Laird, Hidenobu Mori, Hisayoshi Itoh, Takeshi Wakasa, Tsuyoshi Okamoto, Yoshiharu Koizumi

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Electrical EngineeringIon ImplantationEngineeringApplied PhysicsDisplacement Damage DegradationPhotoelectric MeasurementIon EmissionOptoelectronics

References

	Year	Citations

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