Takeshi Wakasa

Temperature dependence of single-event transient current induced by heavy-ion microbeam on p/sup +//n/n/sup +/ epilayer junctions

Gang Guo, T. Hirao, Jamie S. Laird et al. · IEEE Transactions on Nuclear Science · 2004 · 44 citations

Engineering, Electrical Engineering, Physics +14

Displacement damage degradation of ion-induced charge in Si pin photodiode

Shinobu Onoda, Toshio Hirao, Jamie S. Laird et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2003 · 19 citations

Engineering, Electrical Engineering, Materials Science +16

Studies on single-event phenomena using the heavy-ion microbeam at JAERI

Toshio Hirao, Hidenobu Mori, Jamie S. Laird et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2003 · 11 citations

Natural Sciences, Physics, Instrumentation +8

Non-linear charge collection mechanisms in high-speed communication avalanche photodiodes

Jamie S. Laird, Toshio Hirao, Shinobu Onoda et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2005 · 10 citations

Engineering, Electrical Engineering, Physics +13