Materials science forum · 2004 · 215 citations · 6 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationSpectroscopic AnalysisStructural MaterialsDefect CharacterizationDiffractionFine StructureMicrostructure - Property RelationshipsMicrostructure AnalysisStructure DeterminationDiffraction AnalysisDiffraction PatternsInstrumental Line BroadeningLine Profile AnalysisPeak Profile AnalysisProfile MatchingStructural DefectsVoigt Profile Analysis
A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of broadened lines of constant wavelength diffraction patterns is presented. The approach is based on the Voigt approximation and can be combined with the Rietveld method as well as with the profile matching (Le Bail fit) procedure. Both the instrumental and sample profiles are supposed to be well described by Voigt functions. To get reliable sample parameters a good knowledge of the Instrumental Resolution Function (IRF) is needed. Only a phenomenological treatment, in terms of coherent size domains and strains due to structural defects, is performed.
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