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A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors
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2002
Year
Electrical EngineeringReliability EngineeringEngineeringService Life PredictionLow-cycle FatigueCircuit ReliabilityPower SemiconductorsPower ElectronicsLifetime Prediction ModelNovel ThermomechanicsMechanics Of MaterialsPhysic Of FailureDevice Reliability
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