TSC data-analysis on heavily irradiated silicon detectors

Savitzky-Golay Smoothing Filters

William H. Press, Saul A. Teukolsky · Computers in Physics · 1990 · 11.8K citations · Full text

Computing, Aerospace Engineering, Optics +2

Impurity centers in PN junctions determined from shifts in the thermally stimulated current and capacitance response with heating rate

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Engineering, Electrical Engineering, Materials Science +17

Trapping center parameters in indium selenide single crystals by thermally stimulated current measurements

G. Micocci, Aurora Rizzo, A. Tepore · Journal of Applied Physics · 1983 · 51 citations

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Thermally stimulated current spectroscopy: Experimental techniques for the investigation of silicon detectors

Alberto Baldini, M. Bruzzi · Review of Scientific Instruments · 1993 · 35 citations

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On the determination of deep level center energy and concentration by thermally stimulated conductivity measurements using reverse-biased p-n junctions

L. Forbes, C. T. Sah · Solid-State Electronics · 1971 · 34 citations

Engineering, Electrical Engineering, Materials Science +13