Concepedia

On the determination of deep level center energy and concentration by thermally stimulated conductivity measurements using reverse-biased p-n junctions

L. Forbes, C. T. Sah

Solid-State Electronics · 1971 · 34 citations · 5 references

DOI

Concepts

References

5

Thermal and optical emission and capture rates and cross sections of electrons and holes at imperfection centers in semiconductors from photo and dark junction current and capacitance experiments

C. T. Sah, L. Forbes, Laurence Rosier et al. · Solid-State Electronics · 1970 · 452 citations

, , +17

Photoconductivity in solids

Robert Sehr · Journal of the Franklin Institute · 1960 · 394 citations

THERMAL EMISSION RATES OF CARRIERS AT GOLD CENTERS IN SILICON

C. T. Sah, L. Forbes, L. I. Rosier et al. · Applied Physics Letters · 1969 · 129 citations

, , +17

Determination of deep centers in silicon by thermally stimulated conductivity measurements

H. Schade, D.C. Herrick · Solid-State Electronics · 1969 · 42 citations

, , +14

A Technique for Trap Determinations in Low-Resistivity Semiconductors

Leonard R. Weisberg, H. Schade · Journal of Applied Physics · 1968 · 42 citations

, , +14