Applied Physics Letters · 1991 · 19 citations · 9 references
EngineeringMaterials SciencePhysicsMicroelectronicsSemiconductor DevicesSemiconductor MaterialsChemical Vapor DepositionDopingSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsTwo-dimensional SemiconductorsDoped SemiconductorsElectron MobilityHigh-electron-mobility TransistorsLow-pressure Chemical Vapor DepositionMetalorganic Chemical Vapor DepositionModulation DopingTwo-dimensional Electron GasesTwo-dimensional Semiconductor Heterostructures
Delta-doped (δ-doped)GaAs/In0.25Ga0.75As/GaAs strained-layer modulation-doped field-effect transistor (δ-SMODFET) structures grown by the low-pressure metalorganic chemical vapor deposition (LP-MOCVD) technique have been studied for the first time. The δ-doped GaAs, adopted as the electron supplier, was obtained by a stop-growth process so that a very thin and heavily doped layer (1.9×1013 cm−2) can be realized. Experimental results show that a structure with an 80 Å In0.25Ga0.75As layer as the active channel and an 80 Å spacer layer demonstrated the highest two-dimensional electron gases mobility of 26 800 cm2/V s. This structure is easy to achieve by the LP-MOCVD method because the growth of AlGaAs is avoided and is promising for high performance FETs.
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Defects in epitaxial multilayers
J. W. Matthews, A. E. Blakeslee · Journal of Crystal Growth · 1974 · 1.5K citations
GaAs structures with electron mobility of 5×106 cm2/V s
J. H. English, A. C. Gossard, H. L. Störmer et al. · Applied Physics Letters · 1987 · 142 citations
E. F. Schubert, J. E. Cunningham, W. T. Tsang et al. · Applied Physics Letters · 1987 · 81 citations