The range of validity of EELS microanalysis formulae

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	Year	Citations
<i>K</i>, <i>L</i>, and <i>M</i> shell generalized oscillator strengths and ionization cross sections for fast electron collisions Richard D. Leapman, Peter Rez, D. F. Mayers The Journal of Chemical Physics EngineeringNuclear PhysicsComputational ChemistryElectron Cloud EffectsElectron Physic	1980	301
K-shell ionization cross-sections for use in microanalysis R.F. Egerton Ultramicroscopy K-shell Ionization Cross-sectionsEngineeringMass SpectrometryAtomic PhysicsAnalytical Chemistry	1979	228
Scanning Electron Microscopy/1976/I Kerry O’Donnell, O. Johari, Robert P. Becker Mycologia EngineeringElectron MicroscopyPhysicsMicroscopyScanning Probe Microscopy	1977	175
Formulae for light-element micro analysis by electron energy-loss spectrometry R.F. Egerton Ultramicroscopy Light-element Micro AnalysisAtomic Emission SpectroscopyNatural SciencesSpectroscopyElectron Spectroscopy	1978	170
Quantitative microanalysis by electron energy-loss spectroscopy: Two corrections Alan Stephens Ultramicroscopy EngineeringElectron MicroscopyPhysicsElectron SpectroscopyNatural Sciences	1980	33

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