Concepedia

Analysis of RHEED data from the GaAs(001)2 × 4 surface

J.M. McCoy, U. Korte, P. A. Maksym, G. Meyer‐Ehmsen

Surface Science · 1992 · 45 citations · 26 references

DOI

Concepts

References

26

An Algorithm for Least-Squares Estimation of Nonlinear Parameters

Donald W. Marquardt · Journal of the Society for Industrial and Applied Mathematics · 1963 · 30.4K citations

, , +11

Relativistic Hartree–Fock X-ray and electron scattering factors

P. A. Doyle, Peter S. Turner · Acta Crystallographica Section A · 1968 · 1.9K citations

, , +14

Atomic structure of GaAs(100)-(2×1) and (2×4) reconstructed surfaces

D. J. Chadi · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1987 · 456 citations

, , +17

Many-Beam Calculation of Reflection High Energy Electron Diffraction (RHEED) Intensities by the Multi-Slice Method

Ayahiko Ichimiya · Japanese Journal of Applied Physics · 1983 · 278 citations

, , +16

Reflection high energy electron diffraction characteristic absences in GaAs(100) (2×4)–As: A tool for determining the surface stoichiometry

H. H. Farrell, C. J. Palmstro m · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1990 · 254 citations

, , +14