Journal of Physics Condensed Matter · 2008 · 38 citations · 15 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsThin FilmsLuminescent MaterialsOptoelectronic MaterialsOxide SemiconductorsRare-earth-doped MaterialsSemiconductor SurfacesThin Film Optical PropertiesElectroluminescenceFull Width At Half MaximumPhotoluminescencePhotoluminescence SpectroscopyRare-earth-doped Luminescent MaterialsSilica-based MaterialsSilicate ChemistryX-ray Diffraction Analysis
Si-rich silicon oxide (SRO)/Er-Si-O/SRO multilayers were prepared on p-Si substrates using magnetron sputtering. X-ray diffraction measurements indicate that a mixture of silicates Er(2)Si(2)O(7) and Er(2)SiO(5) was formed after the multilayers were annealed at 1000 and 1150 °C. Strong Er(3+) 1.53 µm photoluminescence (PL) at room temperature has been observed from these multilayers and the full width at half-maximum of the 1.53 µm peak is less than 1.8 nm for the multilayers annealed at 1150 °C. Er(3+) 1.53 µm electroluminescence has been observed from erbium silicate films for the first time.
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Efficient Luminescence and Energy Transfer in Erbium Silicate Thin Films
M. Miritello, F. Iacona, G. Franzò et al. · Advanced Materials · 2007 · 138 citations
Natural Sciences, Materials Engineering, Materials Science +17